Unlock the Power of TOF-SIMS
In this episode, Dr. Tatyana Kravchuk and Dr. Lyle Gordon explain the operating principles and theory of Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) and demonstrate its broad applications in surface investigation across industries, including semiconductors, optical devices, paints, chemistry, and advanced materials.
You will gain an understanding of how TOF-SIMS can resolve chemical compositions, molecular structures, and provide 3D depth profiling in both organic and inorganic materials. In addition, our experts will share case studies and practical tips to help you maximize the results of TOF-SIMS in your research and development efforts.
Who should watch?
This webinar has been designed for researchers and engineers looking to advance their knowledge and skills in surface and thin film analysis for product R&D. Anyone interested in learning more about modern surface characterization methods will benefit from the lecture.
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What You’ll Learn About TOF-SIMS:
- How does this technique work?
- What are its advantages and disadvantages?
- What properties can it measure or help analyze?
- What are some examples of TOF-SIMS applications in industry R&D?
- What are the popular modes of operation?
- Which samples and applications the technique is best suited for, and how should samples be prepared?
About TOF-SIMS
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a highly sensitive surface analytical technique, well-established across many industrial and research applications. It provides detailed elemental and molecular information about surfaces, thin layers, interfaces, and enables full three-dimensional analysis of samples. Its use is widespread, including applications in semiconductors, polymers, paints, coatings, glass, paper, metals, ceramics, biomaterials, and pharmaceuticals.