Under the Microscope: Your Electron Microscopy Questions Answered
This on-demand webinar gives you access to the full recording of our live session where experts addressed the most common and practical questions engineers and scientists encounter when using electron microscopy. Viewers can now watch the event at their convenience and learn directly from real examples and audience questions discussed during the live presentation.
The session provides straightforward guidance for improving imaging workflows, selecting the right technique, preparing samples effectively, and interpreting complex microstructural and compositional features.
Who Should Attend?
This on demand webinar is valuable for professionals who rely on high resolution imaging and materials characterization, including:
- Materials scientists and engineers
- Semiconductor packaging and device engineers
- Failure analysis specialists
- Researchers studying morphology, interfaces, or microstructure
- Both new and experienced electron microscopy users looking for practical, experience driven insights
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What You’ll Learn
During the live session, the presenter walked through foundational concepts and user submitted questions that helped attendees:
- Understand the differences between SEM, TEM, and FIB and when each technique is best suited for specific applications
- Improve imaging quality by adjusting beam parameters, detector choices, and contrast settings
- Recognize and troubleshoot common artifacts such as charging, beam damage, and curtaining
- Apply sample preparation methods that yield more reliable imaging results
- Interpret microstructural and compositional information with greater clarity
All these insights are captured in the on-demand recording and available to you for continued reference.
About Electron Microscopy
Electron microscopy enables exceptional resolution and contrast for analyzing surfaces, interfaces, defects, and internal structures at the micro and nanoscale. Unlike optical microscopy, these techniques use focused electron beams to reveal fine details essential for semiconductor packaging, energy storage systems, advanced materials, and failure analysis.
This webinar provides practical explanations and real-world examples to help users better understand how electron microscopy methods can support their work and how to navigate common challenges during analysis.