Precision in Thin Film Metrology: Techniques, Challenges, and Real-World Applications
Join us for an exciting episode where we will dive deep into thin film measurement methods! Our experts, Dr. Lyle Gordon and Dr. Max Junda, are ready to share their knowledge with you. In this engaging webinar, you’ll learn about the different techniques used in thin film metrology and how they are applied in various industries.
Who Should Watch?
This webinar has been designed for materials scientists, process engineers, and R&D professionals seeking to enhance their understanding of thin film measurement techniques. If you are specialists working with coatings, optimizing deposition processes, or developing multilayer systems or even a researcher in advanced materials – you will find value in the content. No previous knowledge in thin film metrology is necessary.
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What You’ll Learn:
- The basics of film measurement techniques including ellipsometry, X-ray reflectometry (XRR), X-ray fluorescence (XRF), and cross-sectional analysis
- How to choose the optimal measurement approach for your specific samples
- The benefits and the constraints of each technique
- Case studies with detailed examples and results
What is Thin Film Metrology?
Thin film metrology involves nondestructive measurements of physical and optical properties of thin films, from angstroms to microns in thickness deposited on a very flat substrate. These measurements are crucial for understanding and controlling the quality and performance of thin films in various applications like semiconductor manufacturing, optical coatings, and solar panels. The parameters which are usually measured are: thickness, composition, structure, and uniformity are essential for quality control, process optimization, and product development. The field employs a variety of analytical approaches including optical, X-ray, and physical measurement techniques.